发明名称 A METHOD FOR MAKING A SEMICONDUCTOR DEVICE THAT INCLUDES A METAL GATE ELECTRODE
摘要 <p>A method for making a semiconductor device is described. That method comprises forming a hard mask and an etch stop layer on a patterned sacrificial gate electrode layer. After first and second spacers are formed on opposite sides of that patterned sacrificial layer, the patterned sacrificial layer is removed to generate a trench that is positioned between the first and second spacers. At least part of the trench is filled with metal layer.</p>
申请公布号 WO2005067026(A1) 申请公布日期 2005.07.21
申请号 WO2004US43362 申请日期 2004.12.23
申请人 INTEL CORPORATION;DOCZY, MARK, L.;BRASK, JUSTIN, K.;KAVALIEROS, JACK;SHAH, UDAY;BARNS, CHRIS, E.;CHAU, ROBERT, S. 发明人 DOCZY, MARK, L.;BRASK, JUSTIN, K.;KAVALIEROS, JACK;SHAH, UDAY;BARNS, CHRIS, E.;CHAU, ROBERT, S.
分类号 H01L21/28;H01L21/336;H01L21/8238;H01L29/49;(IPC1-7):H01L21/336 主分类号 H01L21/28
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