发明名称 INSPECTION DEVICE AND INSPECTION METHOD FOR TRANSPARENT ELECTRODE
摘要 PROBLEM TO BE SOLVED: To provide an inspection device and inspection method for a transparent electrode by seeing. SOLUTION: The inspection device 10 is provided with a light source 14 emitting light 16 irradiated on a substrate 12, a filter 18 transmitting only light 16 of wavelength with different reflectivity in a plurality of layers including the transparent electrode and reflectivity in a layer not including the transparent electrode, and a camera 20 for receiving light 16 having passed the filter 18. In the case of a large reflectivity ratio, ideally in the case of maximum one, the transparent electrode can be photographed. COPYRIGHT: (C)2005,JPO&NCIPI
申请公布号 JP2005195531(A) 申请公布日期 2005.07.21
申请号 JP20040003931 申请日期 2004.01.09
申请人 CHI MEI ELECTRONICS CORP 发明人 NAKATANI FUMIYOSHI
分类号 G01B11/24;G02F1/13;G02F1/1343;H01L51/50;H05B33/14;(IPC1-7):G01B11/24;G02F1/134 主分类号 G01B11/24
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