发明名称 |
Semiconductor device, method of manufacturing same and method of designing same |
摘要 |
A partial oxide film ( 31 ) with well regions formed therebeneath isolates transistor formation regions in an SOI layer ( 3 ) from each other. A p-type well region ( 11 ) is formed beneath part of the partial oxide film ( 31 ) which isolates NMOS transistors from each other, and an n-type well region ( 12 ) is formed beneath part of the partial oxide film ( 31 ) which isolates PMOS transistors from each other. The p-type well region ( 11 ) and the n-type well region ( 12 ) are formed in side-by-side relation beneath part of the partial oxide film ( 31 ) which provides isolation between the NMOS and PMOS transistors. A body region is in contact with the well region ( 11 ) adjacent thereto. An interconnect layer formed on an interlayer insulation film ( 4 ) is electrically connected to the body region through a body contact provided in the interlayer insulation film ( 4 ). A semiconductor device having an SOI structure reduces a floating-substrate effect.
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申请公布号 |
US2005156242(A1) |
申请公布日期 |
2005.07.21 |
申请号 |
US20050034938 |
申请日期 |
2005.01.14 |
申请人 |
MITSUBISHI DENKI KABUSHIKI KAISHA |
发明人 |
YAMAGUCHI YASUO;MAEGAWA SHIGETO;IPPOSHI TAKASHI;IWAMATSU TOSHIAKI;MAEDA SHIGENOBU;HIRANO YUUICHI;MATSUMOTO TAKUJI;MIYAMOTO SHOICHI |
分类号 |
H01L21/762;H01L21/331;H01L21/8238;H01L21/84;H01L27/01;H01L27/08;H01L27/092;H01L27/12;H01L29/786;H01L31/00;(IPC1-7):H01L27/01 |
主分类号 |
H01L21/762 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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