发明名称 |
Method of forming a semiconductor device including simultaneously forming a single crystalline epitaxial layer and a polycrystalline or amorphous layer |
摘要 |
A method of fabricating a semiconductor device according to the present invention includes a step A of forming a polycrystalline or amorphous preliminary semiconductor layer on a surface of a substrate so as to have an opening portion and a step B of simultaneously forming an epitaxial growth layer on an exposed portion of a surface of the substrate through the opening portion and a non-epitaxial growth layer on the preliminary semiconductor layer using a CVD method while heating the substrate inside a reaction chamber by means of a heat source inside the reaction chamber, the epitaxial growth layer being made of single crystalline semiconductor, and the non-epitaxial growth layer being comprised of a polycrystalline or amorphous semiconductor layer. |
申请公布号 |
US6919253(B2) |
申请公布日期 |
2005.07.19 |
申请号 |
US20030359553 |
申请日期 |
2003.02.07 |
申请人 |
MATSUSHITA ELECTRIC INDUSTRIAL CO., LTD. |
发明人 |
SAITOH TOHRU;NOZAWA KATSUYA;KUBO MINORU;AOKI SHIGETAKA |
分类号 |
H01L21/20;H01L21/205;H01L21/331;(IPC1-7):H01L21/331 |
主分类号 |
H01L21/20 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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