发明名称 Film bulk acoustic resonator
摘要 FBAR device includes a membrane supporting layer between a substrate and a membrane layer, surrounding an air gap region. The membrane supporting layer support the membrane layer to obtain a robust structure. The substrate has a first area and a second area surrounding the first area. The membrane supporting layer is formed on the second area of the substrate so as to form the air gap on the first area of the substrate. The membrane layer is formed on the membrane supporting layer and the air gap. A first electrode is formed on a portion of the membrane layer. A piezoelectric layer is formed on a portion of the first electrode. A second electrode is formed on a portion of the piezoelectric layer.
申请公布号 US6917139(B2) 申请公布日期 2005.07.12
申请号 US20010983639 申请日期 2001.10.25
申请人 SAMSUNG ELECTRO-MECHANICS CO., LTD. 发明人 SUNWOO KUK HYUN;KIM HYOUNG JUN;JANG JAE WOOK
分类号 H01L41/22;H01L41/08;H01L41/09;H02N2/00;H03H3/02;H03H9/17;H03H9/25;(IPC1-7):H01L41/04 主分类号 H01L41/22
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