| 摘要 |
An enclosure integrated detector probe system is provided for manufacturing processes. The system, according to an embodiment, may provide: at least one section of enclosure material having a flow path, the section having a node extending from one wall of the section into a flow path, at least one exhaustible power source, at least one transmitter, and at least one detector located in the node and in electrical communication with the transmitter powered by the exhaustible power source.
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