发明名称 METHOD OF FORMING PATTERN
摘要 <P>PROBLEM TO BE SOLVED: To improve a resist pattern obtained by an immersion lithography. <P>SOLUTION: A method of forming the pattern includes a step of forming a resist film 102 on a substrate 101 and a step of exposing the surface of the formed resist film 102 with an aqueous solution 103 containing an acid compound having a hydrophilic group, such as, for example, an acetic acid. Then, in the state that an immersion solution 104 is arranged on the resist film 102 exposed to the aqueous solution 103, an exposure light 105 is selectively irradiated to the resist film 102, and pattern exposure is performed, then, the resist film 102 is developed to which the pattern exposure is performed, and the resist pattern 102 is formed from the resist film 102. <P>COPYRIGHT: (C)2005,JPO&NCIPI
申请公布号 JP2005183438(A) 申请公布日期 2005.07.07
申请号 JP20030417836 申请日期 2003.12.16
申请人 MATSUSHITA ELECTRIC IND CO LTD 发明人 ENDO MASATAKA;SASAKO MASARU
分类号 G03F7/38;G03F7/00;G03F7/20;H01L21/027 主分类号 G03F7/38
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