| 摘要 |
PROBLEM TO BE SOLVED: To provide a method and an apparatus having a simple structure for analyzing specimens, which accurately moves an optical device relative to a test paper, in order to carry out a highly precise specimen analysis. SOLUTION: The test paper 15 is irradiated with radiation from a light emitting section 44 of the optical device 32 at its test position. The optical device 32 receives reflection light at a light-receiving section 45, while relatively moving along the test paper 15. First and second reference reflecting sections 30a, 19a, by which reference intensity values of reflection light are obtained, are disposed at the test position and the test paper 15. After detecting the first reference reflective section 30a on the test position, the second reference reflective section 19a on the test paper 15 is detected by the optical device 32, whereby the arranged position of the test paper 14 is specified by a control means 7, before carrying out the specimen analysis, using each test piece 18. Then, gain and offset adjustments at the light-receiving section are carried out, based on the intensity of the reflection light at the second reference reflecting section 19a, before carrying out the specimen analysis using each test piece 18. When the gain and offset width values deviate from those previously set, error signals are output. COPYRIGHT: (C)2005,JPO&NCIPI
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