发明名称 Method of manufacturing thin film transistor, method of manufacturing flat panel display, thin film transistor, and flat panel display
摘要 A method of manufacturing a thin film transistor and a method of manufacturing a flat panel display without increasing the number of heat treatment steps, and a thin film transistor and a flat panel display obtained by such methods are disclosed. A semiconductor region having an island shape is formed on an insulating substrate. A gate electrode is formed above the semiconductor region with a gate dielectric film being located therebetween. An impurity is implanted to the semiconductor region using the gate electrode as a mask, thereby forming source and drain regions in a self-aligned manner at both sides of a channel region. An interlayer dielectric film is formed on the gate electrode and the gate dielectric film. Thereafter, a step of activating the impurity and a step of burning the interlayer dielectric film are simultaneously performed in a single heat treatment step.
申请公布号 US2005148119(A1) 申请公布日期 2005.07.07
申请号 US20050028650 申请日期 2005.01.05
申请人 KABUSHIKI KAISHA TOSHIBA 发明人 FUJIMURA TAKASHI
分类号 H01L21/20;G02F1/136;H01L21/336;H01L29/786;(IPC1-7):H01L29/04;H01L29/10;H01L31/036;H01L31/037;H01L31/20;H01L27/108;H01L29/76;H01L29/94;H01L31/119 主分类号 H01L21/20
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