发明名称 MEASURING INSTRUMENT SYSTEM
摘要 PROBLEM TO BE SOLVED: To provide a measuring instrument system, capable of improving indication quality, even when arranging an indication element in front of a pointer-type indicator. SOLUTION: A pointer 4, a mark plate 5 having a marking part 51 indicated by the pointer 4 and an indication element 6, having a display D arranged in the front of the mark plate 5 and the pointer 4 and indicating specific information are provided. The system has a reflector 65, in which the indication element 6 forms a background of the display D by reflecting the light introduced from the front, and a transparent part T formed around the reflector 65 and through which at least a part of the pointer 4 and the marking part 51 can be seen. COPYRIGHT: (C)2005,JPO&NCIPI
申请公布号 JP2005181054(A) 申请公布日期 2005.07.07
申请号 JP20030421033 申请日期 2003.12.18
申请人 NIPPON SEIKI CO LTD 发明人 IGARASHI HIDEKI
分类号 G01D7/04;B60K35/00;G01D11/26;G01D11/28;(IPC1-7):G01D11/28 主分类号 G01D7/04
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