发明名称 BLANK FOR HALFTONE TYPE PHASE SHIFT MASK, AND METHOD FOR MANUFACTURING HALFTONE TYPE PHASE SHIFT MASK
摘要 <p><P>PROBLEM TO BE SOLVED: To provide a blank for a halftone type phase shift mask, capable of providing a blank improving the size precision of a pattern of a halftone film much higher than before, using a halftone blank structure provided with no light shielding film, and to provide a method for manufacturing the halftone type phase shift mask. <P>SOLUTION: In the blank for the halftone type phase shift mask formed by laminating the halftone film on a transparent substrate 1, a thin-film conductive layer 3 is formed on the halftone film 2. <P>COPYRIGHT: (C)2005,JPO&NCIPI</p>
申请公布号 JP2005181895(A) 申请公布日期 2005.07.07
申请号 JP20030425698 申请日期 2003.12.22
申请人 TOPPAN PRINTING CO LTD 发明人 IWAKATA MASAHIDE
分类号 G03F1/32;G03F1/68;H01L21/027;(IPC1-7):G03F1/08 主分类号 G03F1/32
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