发明名称 FREQUENCY CHARACTERIZATION OF QUARTZ CRYSTALS
摘要 Techniques for determining a frequency profile of a quartz crystal in real time. Quartz crystals are subjected to a series of temperature cycles at various temperature rates and the crystal frequencies, crystal temperature parameters, and the temperature rat es are monitored as the crystal is subjected to the temperature cycles. The monitored frequencie s are grouped correlated with the monitored temperature parameters and temperature rates. A system for determining the frequency of a quartz crystal includes a processor adapted t o perform the frequency profiling techniques.
申请公布号 CA2487876(A1) 申请公布日期 2005.07.07
申请号 CA20042487876 申请日期 2004.11.18
申请人 SCHLUMBERGER CANADA LIMITED 发明人 GUNAWARDANA, RUVINDA
分类号 G01K7/32;G01N33/38;G01R29/22;G01R31/28;H03H9/02;H03H9/19;(IPC1-7):G01N25/20;G01N33/24;H03L1/02 主分类号 G01K7/32
代理机构 代理人
主权项
地址