发明名称 Inspecting apparatus for foreign matter and inspecting mechanism thereof
摘要 A turn controllable inspection table which have a step between a portion where mount sections on which respective objects being inspected are mounted are formed along a circumference and an inside portion thereof, so that light from a light source illuminating a side face portion of each object being inspected is allowed to be incident on at least a side face region including a bottom portion of a side face of each object being inspected in a direction perpendicular to the side face region is provided. Further, clamps for fixing the respective objects being inspected onto the mount sections by pressing a head portion of each object being inspected with a top board made of a transparent member, so that inspection is possible across an entire region from all directions including directions from above and sideways of each object being inspected are provided. Consequently, it is possible to provide an inspecting apparatus for a foreign matter capable of eliminating a blind spot in an illuminated region and a pictured region of an object being inspected, and capable of detecting the presence or absence of a suspended foreign matter inside a container as a an object being inspected at a high accuracy without stopping the production line, and an inspecting mechanism thereof.
申请公布号 US6914672(B2) 申请公布日期 2005.07.05
申请号 US20020251234 申请日期 2002.09.19
申请人 SCAN TECHNOLOGY CO., LTD. 发明人 YAGITA KIYOSHI
分类号 G01N21/90;(IPC1-7):G01N21/90 主分类号 G01N21/90
代理机构 代理人
主权项
地址