| 摘要 |
PROBLEM TO BE SOLVED: To provide a microscope by which a phase object or the ruggedness of a surface can be observed at comparatively low image formation power≤4 times in a wide observation range and in a comparatively narrow range of spatial frequency distribution. SOLUTION: In the microscope provided with a light source 2, an illuminating optical system 3 for guiding light from the light source 2 to an observing object 4, a partial aperture arranged on an approximate pupil position 28 of the illuminating optical system 3, and image forming optical systems 15, 16, 18 for forming an image of the observing object 4 illuminated by light passed through the partial aperture on an image formation surface 19 and provided also with an eyepiece optical system 6 or an image pickup optical system for observing the image formed on the image formation surface 19, the diameter of the image through the partial aperture on the pupil position 30 of the image forming optical system is set shorter than the diameter of the pupil of the image forming optical system and wave front leading means for leading a wave front of which size is changed in accordance with the diameter of the pupil is arranged on the pupil position 30 of the image forming optical system. COPYRIGHT: (C)2005,JPO&NCIPI
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