发明名称 Method and structure for fabricating a halftone mask for the manufacture of semiconductor wafers
摘要 A method for manufacturing a mask for integrated circuit devices. The method includes providing a quartz substrate having a surface and forming a MoSi film overlying the surface of the quartz substrate. The method also includes patterning the MoSi film overlying the quartz substrate to form a mask pattern. A step of forming an opaque edge structure comprising a carbon bearing material on a portion of the surface around a peripheral region of the mask pattern is also included.
申请公布号 US2005142892(A1) 申请公布日期 2005.06.30
申请号 US20040773519 申请日期 2004.02.06
申请人 SEMICONDUCTOR MANUFACTURING INTERNATIONAL (SHANGHAI) CORPORATION 发明人 LU CONG
分类号 G03F1/00;G03F1/08;H01L21/027;H01L21/31;H01L21/82;(IPC1-7):H01L21/31 主分类号 G03F1/00
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