发明名称 METHODS OF REDUCING PLASMA-INDUCED DAMAGE FOR ADVANCED PLASMA CVD DIELECTRICS
摘要 A method for depositing an organosilicate layer on a substrate includes varying one or more processing conditions during a process sequence for depositing an organosilicate layer from a gas mixture comprising an organosilicon compound in the presence of RF power in a processing chamber. In one aspect, the distance between the substrate and a gas distribution manifold in the processing chamber is varied during processing. Preferably, the method of depositing an organosilicate layer minimizes plasma-induced damage to the substrate.
申请公布号 WO2005019497(A3) 申请公布日期 2005.06.30
申请号 WO2004US27192 申请日期 2004.08.20
申请人 APPLIED MATERIALS, INC.;LI, LIHUA;TANAKA, TSUTOMU;HUANG, TZU-FANG;XIA, LI-QUN;SUGIARTO, DIAN;SIVARAMAKRISHNAN, VISWESWAREN;LEE, PETER, WAI-MAN;SILVETTI, MARIO, D. 发明人 LI, LIHUA;TANAKA, TSUTOMU;HUANG, TZU-FANG;XIA, LI-QUN;SUGIARTO, DIAN;SIVARAMAKRISHNAN, VISWESWAREN;LEE, PETER, WAI-MAN;SILVETTI, MARIO, D.
分类号 C23C16/40;C23C16/509;H01L21/312;H01L21/316;H01L21/768 主分类号 C23C16/40
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