PROBER AND METHOD FOR TESTING WAFER,申请号KR20030098298-传众专利搜索

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发明名称	PROBER AND METHOD FOR TESTING WAFER
摘要
申请公布号	KR20050066816(A)	申请公布日期	2005.06.30
申请号	KR20030098298	申请日期	2003.12.27
申请人	DONGBUANAM SEMICONDUCTOR INC.	发明人	JU, CHANG YOUNG
分类号	H01L21/66;(IPC1-7):H01L21/66	主分类号	H01L21/66
代理机构		代理人
主权项
地址

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