发明名称 METHOD FOR MANUFACTURING SEMICONDUCTOR DEVICE, AND MANUFACTURING EQUIPMENT OF SEMICONDUCTOR DEVICE
摘要 PROBLEM TO BE SOLVED: To provide a method for manufacturing a semiconductor device wherein a contact hole of high aspect ratio can be formed stably. SOLUTION: The method for manufacturing a semiconductor device contains a process which arranges a substrate on which a film was formed in a vacuum chamber, facing an electrode plate in which a plurality of gas-leading holes were formed; a process which introduces gas in the vacuum chamber through a plurality of the gas-leading holes formed in the electrode plate; and a process which impresses high frequency power to the electrode plate in order to generate plasma for performing plasma treatment of the film formed on the substrate. Distribution of diameters of a plurality of the gas-leading holes on a surface of the electrode plate is adjusted to distribution corresponding to distribution of plasma treatment property on the surface of the substrate, so that the plasma treatment property on the surface of the substrate becomes within a predetermined range. COPYRIGHT: (C)2005,JPO&NCIPI
申请公布号 JP2005175294(A) 申请公布日期 2005.06.30
申请号 JP20030415224 申请日期 2003.12.12
申请人 MATSUSHITA ELECTRIC IND CO LTD 发明人 MATSUMOTO SEIJI;KAWAMURA TAKESHI;SAKAMOTO MASANORI;NAKADA HIROTOSHI
分类号 H01L21/3065;(IPC1-7):H01L21/306 主分类号 H01L21/3065
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