发明名称 Semiconductor display device and manufacturing method thereof
摘要 A semiconductor display device with an interlayer insulating film in which surface levelness is ensured with a limited film formation time, heat treatment for removing moisture does not take long, and moisture in the interlayer insulating film is prevented from escaping into a film or electrode adjacent to the interlayer insulating film. A TFT is formed and then a nitrogen-containing inorganic insulating film that transmits less moisture compared to organic resin film is formed so as to cover the TFT. Next, organic resin including photosensitive acrylic resin is applied and an opening is formed by partially exposing the organic resin film to light. The organic resin film where the opening is formed, is then covered with a nitrogen-containing inorganic insulating film which transmits less moisture than organic resin film does. Thereafter, the gate insulating film and the two layers of the nitrogen-containing inorganic insulating films are partially etched away in the opening of the organic resin film to expose the active layer of the TFT.
申请公布号 US6911688(B2) 申请公布日期 2005.06.28
申请号 US20030412687 申请日期 2003.04.14
申请人 SEMICONDUCTOR ENERGY LABORATORY CO., LTD. 发明人 YAMAZAKI SHUNPEI;MURAKAMI SATOSHI;HAYAKAWA MASAHIKO;KATO KIYOSHI;OSAME MITSUAKI;HIROSUE TAKASHI;FUJIKAWA SAISHI
分类号 H01L51/50;G09F9/30;H01L21/312;H01L21/316;H01L21/318;H01L21/336;H01L21/77;H01L21/84;H01L27/12;H01L27/13;H01L27/32;H01L29/49;H01L29/786;(IPC1-7):H01L27/108;H01L29/76;H01L29/94;H01L31/119 主分类号 H01L51/50
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