发明名称 Arrangement for preventing short-circuiting in a bipolar double-poly transistor and a method of fabricating such an arrangement
摘要 In a bipolar double-poly transistor comprising a layer of base silicon ( 1 ') on a silicon substrate ( 2 '), a first layer of silicon dioxide ( 3 ') on the base silicon layer ( 1 '), an emitter window ( 4 ') extending through the first layer ( 3 ') of silicon dioxide and the base silicon layer ( 1 '), a second layer ( 5 ') of silicon dioxide in the emitter window ( 4 '), silicon nitride spacers ( 6 ') on the second layer ( 5 ') of silicon dioxide in the emitter window ( 4 '), and emitter silicon ( 9 ') in the emitter window ( 4 '), an isolating silicon nitride seal is provided to separate the base silicon ( 1 ') from the emitter silicon ( 9 ') to prevent short-circuiting between the base silicon ( 1 ') and the emitter silicon ( 9 ') in the transistor.
申请公布号 US6911368(B2) 申请公布日期 2005.06.28
申请号 US20040893604 申请日期 2004.07.16
申请人 INFINEON TECHNOLOGIES AG 发明人 JOHANSSON TED;NORSTROEM HANS;LINDGREN ANDERS
分类号 H01L21/314;H01L21/331;H01L29/06;H01L29/08;H01L29/10;H01L29/732;(IPC1-7):H01L21/331 主分类号 H01L21/314
代理机构 代理人
主权项
地址