SIGNAL WIRE CHANGEOVER CONNECTOR AND SIGNAL WIRE INSPECTION SYSTEM

摘要

PROBLEM TO BE SOLVED: To connect a probe to an optional test point on a substrate without coupling/uncoupling the probe of a measuring device relative to the substrate. SOLUTION: A connector socket 5 where a plurality of test points 4 are arranged intensively is provided on the substrate 3 which is an inspection object. This signal wire changeover connector 2 is equipped with a plurality of conduction pins 2c to be connected respectively to each test point 4, and a plurality of probe points 2b to be connected respectively to the plurality of probes 7. The signal wire changeover connector 2 is also equipped with a function for switching electrically connection between the conduction pin 2c and the probe point 2b. A host PC 8 connected to the signal wire changeover connector 2 has a function for setting connection between the test point 4 and the probe point 2b and informing the signal wire changeover connector 2 of the result. COPYRIGHT: (C)2005,JPO&NCIPI