Semiconductor component arrangement for e.g. adjusting motor vehicle seat, has defect identification circuit with Schmitt trigger to control supply of voltage to semiconductor logic unit, when unit`s temperature exceeds preset temperature

摘要

The arrangement has a defect identification circuit (110) connected to a semiconductor logic unit (M) e.g. power MOSFET. The circuit has a temperature sensor (TS) that outputs a signal indicating the temperature of the logic unit to a Schmitt trigger (DRV) of an analyzer circuit (AWS). The Schmitt trigger interrupts the supply of voltage to the unit when the unit`s temperature exceeds a preset temperature.