发明名称 Soft-error rate hardened pulsed latch
摘要 A latch includes a memory unit, a transfer unit, an inversion unit, and an output unit. The Memory unit includes a number of storage nodes. The transfer unit transfers a data from a data input node to the storage nodes via a plurality of data paths. Each of the data paths includes a pass element controlled by a pulse. The inversion unit inverts the data before the data is transferred from the data input node to at least one of the storage nodes. The output unit outputs the data from the memory unit to a latch output node. The memory unit, the transfer unit, the inversion unit, and the output unit of the latch form a soft-error rate hardened latch structure with a reduced number of elements and reduced power consumption.
申请公布号 US2005134347(A1) 申请公布日期 2005.06.23
申请号 US20030741560 申请日期 2003.12.19
申请人 INTEL CORPORATION 发明人 RUSU STEFAN;HAZUCHA PETER;KARNIK TANAY
分类号 H03K3/037;(IPC1-7):H03K3/037 主分类号 H03K3/037
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