发明名称 METHODS FOR FINDING AND CHARACTERIZING A DEFORMED PATTERN IN AN IMAGE
摘要 A method is disclosed for finding a deformed pattern in an image using a plurality of sub-patterns. By advantageously restricting sub-pattern search ranges, search speed is improved, and the incidence of spurious matches is reduced. The method also quickly decides which sub-pattern result, of several potential candidates, is most likely to be the correct match for a deformed sub-pattern Also, a method is provided for characterizing a deformed pattern in an image by using results from feature-based search tools to create a mapping that models the deformation of the pattern. A transform, selectable by a user, is fit to the results from the search tools to create a global deformation mapping. This transformation is fit only to feature points derived from matches resulting from successful sub-pattern search, without including data from areas of the pattern that were blank, not matched, or otherwise didn't contain information about the pattern's distorted location.
申请公布号 WO2005010803(A3) 申请公布日期 2005.06.23
申请号 WO2004US23130 申请日期 2004.07.19
申请人 COGNEX CORPORATION;DAVIS, JASON 发明人 DAVIS, JASON
分类号 G06K9/00;G06K9/64 主分类号 G06K9/00
代理机构 代理人
主权项
地址
您可能感兴趣的专利