发明名称 In-situ monitoring method and system for mold deformation in nanoimprint
摘要 The present invention provides a method for in-situ real-time monitoring of mold deformation by using a database to store temporary information during the following steps: (a) providing a mark on the mold body that is easy to observe in order to monitor the mold deformation, (b) installing a signal source and a monitor device for monitoring the deformation quantity on the mold, (c) transforming the above deformation quantity into computer signals for storing in the database and (d) issuing controlling or warning signals to the imprinting machine based on the processing results of the stored information in the database.
申请公布号 US6909998(B2) 申请公布日期 2005.06.21
申请号 US20030665191 申请日期 2003.09.16
申请人 HOCHENG HONG;NIEN CHIN CHUNG 发明人 HOCHENG HONG;NIEN CHIN CHUNG
分类号 G01N21/84;G06F11/30;H01L21/31;(IPC1-7):H01L21/31 主分类号 G01N21/84
代理机构 代理人
主权项
地址