发明名称 Method of fabricating a semiconductor device having reduced contact resistance
摘要 A method of fabricating a semiconductor device having the steps of forming an insulating layer on a silicon substrate; forming a contact hole in the insulating layer so that a portion of the silicon substrate is exposed in the contact hole; performing an interface treatment process to the exposed portion of the silicon substrate, wherein the interface treatment process includes at least a dry cleaning and a hydrogen heat treatment; and forming a selective silicon plug including single crystalline and polycrystalline silicon structures on the exposed portion of the silicon substrate.
申请公布号 US6908853(B2) 申请公布日期 2005.06.21
申请号 US20010034243 申请日期 2001.12.28
申请人 HYNIX SEMICONDUCTOR INC. 发明人 SHIN DONG SUK
分类号 H01L21/30;H01L21/285;H01L21/768;(IPC1-7):H01L21/476 主分类号 H01L21/30
代理机构 代理人
主权项
地址