发明名称 Socket for testing a component and method of testing a component
摘要 A socket ( 1 ) for accommodating and testing a component ( 2 ) having several electrical connectors ( 3 ) is disclosed, which socket comprises a substantially rectangular frame ( 4 ) surrounding a space ( 5 ), which frame ( 4 ) includes a first row ( 6 ) and a second row ( 7 ) of electric conductors ( 8 ) which are arranged opposite one another, which conductors ( 8 ) have first section ( 9 ) with a terminal ( 10 ) extending into space ( 5 ) for contacting an electric connector ( 3 ) of the component ( 2 ), and a second section ( 11 ) projecting from the frame ( 4 ). The spacing ( 12 ) between the terminals ( 10 ) in each row ( 6, 7 ) is adjustable. In the method of testing a component ( 2 ) in the socket ( 1 ), the spacing ( 12 ) between the terminals ( 10 ) in each row ( 6, 7 ) is adjusted to establish electrical contact between the electrical connectors ( 3 ) of the component ( 2 ) and its corresponding terminal ( 10 ) by placing the component ( 2 ) in the socket ( 1 ).
申请公布号 US6908315(B2) 申请公布日期 2005.06.21
申请号 US20020181084 申请日期 2002.07.12
申请人 KONINKLIJKE PHILIPS ELECTRONICS N.V. 发明人 GROOT ERIK HAROLD
分类号 G01R1/073;G01R1/04;H01R13/24;H01R33/76;(IPC1-7):H01R9/09 主分类号 G01R1/073
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