发明名称 Method of erasing repeated patterns and pattern defect inspection device
摘要 An image of a subject of inspection is picked up, and this image is demarcated into a plurality of areas. Density differences are found between reference pixels and a plurality of comparison pixels in the demarcated areas, and a density difference that is closest to 0 is determined as a specific density difference. The specific density difference is then applied to the reference density in the image of the subject, whereby repeated patterns in the image are erased.
申请公布号 US6909798(B1) 申请公布日期 2005.06.21
申请号 US20000629141 申请日期 2000.07.31
申请人 MATSUSHITA ELECTRIC INDUSTRIAL CO., LTD. 发明人 YUKAWA NORIAKI;KAWANO HAJIME;AYAKI YUKIHIRO
分类号 G01N21/956;G06K9/00;G06T1/00;G06T7/00;(IPC1-7):G06K9/00 主分类号 G01N21/956
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