INSTRUMENT FOR MEASURING REFLECTIVITY

摘要

PROBLEM TO BE SOLVED: To provide a reflectivity measuring instrument, constituted so as to measure an optical transient response up to a very thin film or the like to be less than a monolayer which has been difficult to measure heretofore with very high time resolution and sensitivity. SOLUTION: This reflectivity measuring instrument has a means for condensing writing light and reading light temporally delayed with respect to the writing light to a substance to be measured and a means for detecting the reflected light from the substance to be measured. COPYRIGHT: (C)2005,JPO&NCIPI