| 摘要 |
PROBLEM TO BE SOLVED: To provide a semiconductor device having a liquid crystal driving circuit which further shortens the gradation voltage test time regardless of the increase of gradations of the liquid crystal driving circuit and the number of output terminals, increases the test speed, and reduces the cost, and a test method therefor. SOLUTION: When the gradation voltage test of the semiconductor device having the liquid crystal driving circuit is performed, a gradation voltage (Vx) generated by the gradation voltage generation circuit 16 of the semiconductor device is compared with a comparison voltage (for example, Vx+ΔV) generated for testing the gradation voltage, and a test result is outputted as a binary voltage from the external terminal of the semiconductor device. COPYRIGHT: (C)2005,JPO&NCIPI
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