发明名称 |
DUAL-GATE FIELD EFFECT TRANSISTOR |
摘要 |
<p>A dual-gate field effect transistor includes two gate insulation films (6-1, 6-2) sandwiching a vertical channel (5) standing on a substrate (1) and arranged between a source (7-1) and a drain (7-2), from a direction orthogonal to the carrier running direction of the vertical channel; and two gate electrodes (3-1, 3-2) respectively facing the vertical channel (5) via the gate insulation films (6-1, 6-2). The gate insulation films (6-1, 6-2) have different thickness values t1,t2. It is also possible that the gate insulation films (6-1, 6-2) have different dielectric constants ϵ1, ϵ2, or the gate electrodes (3-1, 3-2) have different work functions Phi1, Phi2. Thus, it is possible to set the threshold value voltage of the dual-gate field effect transistor to a desired value when manufacturing the transistor. Furthermore, it is possible to prevent the problem of increase of the sub-threshold coefficient which occurs in the conventional technique.</p> |
申请公布号 |
WO2005055326(A1) |
申请公布日期 |
2005.06.16 |
申请号 |
WO2004JP18525 |
申请日期 |
2004.12.06 |
申请人 |
NATIONAL INSTITUTE OF ADVANCED INDUSTRIAL SCIENCE;LIU, YONGXUN;MASAHARA, MEISHOKU;ISHII, KENICHI;SEKIGAWA, TOSHIHIRO;SUZUKI, EIICHI |
发明人 |
LIU, YONGXUN;MASAHARA, MEISHOKU;ISHII, KENICHI;SEKIGAWA, TOSHIHIRO;SUZUKI, EIICHI |
分类号 |
H01L21/336;H01L29/423;H01L29/786;(IPC1-7):H01L29/786 |
主分类号 |
H01L21/336 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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