发明名称 METHOD FOR MEASURING CONTOUR VARIATIONS
摘要 A method for measuring a contour variation of a measuring area on an object. The method includes the steps of: irradiating the measuring area with a light beam, wherein reflection or transmission of the beam occurs; splitting the transmitted or reflected beam; combining the split beams with each other and observing a fringe pattern representing a differential phase between the split beams; varying the phase of the split beams relative to each other, such that the differential phase is kept within the range of 2 pi; calculating an optical path length difference from the differential phase; and relating the optical path length difference to the contour variation of the object.
申请公布号 EP1540271(A1) 申请公布日期 2005.06.15
申请号 EP20030795501 申请日期 2003.09.12
申请人 NEDERLANDSE ORGANISATIE VOOR TOEGEPAST-NATUURWETENSCHAPPELIJK ONDERZOEK TNO 发明人 SAUNDERS, IAN;VAN BRUG, HEDSER;KORPERSHOEK, JACOBUS, JOHANNES
分类号 G01B9/02;G01B11/24;(IPC1-7):G01B9/02 主分类号 G01B9/02
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