发明名称 Method to fabricate high-performance NPN transistors in a BiCMOS process
摘要 A method of forming a quasi-self-aligned heterojunction bipolar transistor (HBT) that exhibits high-performance is provided. The method includes the use of a patterned emitter landing pad stack which serves to improve the alignment for the emitter-opening lithography and as an etch stop layer for the emitter opening etch. The present invention also provides an HBT that includes a raised extrinsic base having monocrystalline regions located beneath the emitter landing pad stack.
申请公布号 US6906401(B2) 申请公布日期 2005.06.14
申请号 US20040856503 申请日期 2004.05.28
申请人 INTERNATIONAL BUSINESS MACHINES CORPORATION 发明人 DUNN JAMES S.;FEILCHENFELD NATALIE B.;LIU QIZHI;STRICKER ANDREAS D.
分类号 H01L21/331;H01L21/8249;H01L29/737;(IPC1-7):H01L29/72 主分类号 H01L21/331
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