发明名称 Integrated circuit timing debug apparatus and method
摘要 A timing debug tool for an IC that enables varying the skew of selected edges of a primary clock signal for a controllable number of clock cycles. The debug tool enables identification, isolation and analysis of timing problems on the IC. An IC including programmable clock skew logic that applies a programmed skew amount to selected edges of a clock signal. A debug system including clock control logic further including a delay block and test logic. The delay block delays a selected number of transitions of a first clock signal to provide a second clock signal, where each selected transition of the second clock signal is delayed, based on a sync signal, by either one of a default skew amount and a programmed skew amount. The test logic enables dynamic control of the sync signal and dynamic programming of the selected skew amount.
申请公布号 US6903582(B2) 申请公布日期 2005.06.07
申请号 US20030682351 申请日期 2003.10.09
申请人 IP FIRST, LLC 发明人 GASKINS DARIUS D.;LUNDBERG JAMES R.
分类号 G01R31/30;G01R31/317;G06F1/10;H03L7/00;H03L7/06;(IPC1-7):H03L7/00 主分类号 G01R31/30
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