发明名称 SEMICONDUCTOR INTEGRATED CIRCUIT
摘要 PROBLEM TO BE SOLVED: To effectively protect a thin film transistor from surges caused by ESD. SOLUTION: In a semiconductor integrated circuit, an internal circuit 12 is constituted of a high-withstand voltage circuit 13 and a low-withstand voltage circuit 15. An ordinary protective circuit for surge is directly connected to an external terminal of an IC on the outside of the internal circuit 12. The high-withstand voltage circuit 13 has a MOS transistor driven with a power-supply voltage VDD. The low-withstand voltage circuit 15 has a MOS transistor driven with a power-supply voltage Vdd lower than the voltage VDD. To the MOS transistor driven with the low-withstand voltage Vdd, protective circuits for surge are individually connected. Capacitors, diodes, etc., are used as the protective circuits. COPYRIGHT: (C)2005,JPO&NCIPI
申请公布号 JP2005142494(A) 申请公布日期 2005.06.02
申请号 JP20030379993 申请日期 2003.11.10
申请人 TOSHIBA CORP 发明人 KITAGAWA NOBUTAKA
分类号 H01L27/04;H01L21/822;H01L21/8234;H01L27/02;H01L27/06;H01L27/088;H02H9/00;(IPC1-7):H01L21/822;H01L21/823 主分类号 H01L27/04
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