发明名称 Multilayered dual bit memory device with improved write/erase characteristics and method of manufacturing
摘要 A dual bit ROM multilayered structure with improved write and erase functions and a method of manufacturing is disclosed. The structure includes a pair of floating gates at the middle or nitride layer to better define the two locations of electrons representing the dual data bits collected in the middle layer.
申请公布号 US2005116281(A1) 申请公布日期 2005.06.02
申请号 US20030725234 申请日期 2003.12.01
申请人 YANG CHIN-TIEN;LIN MU-YI;TSENG YU-WEI;CAO MIN;LEE YU-HUA 发明人 YANG CHIN-TIEN;LIN MU-YI;TSENG YU-WEI;CAO MIN;LEE YU-HUA
分类号 G11C16/04;H01L21/28;H01L21/8246;H01L21/8247;H01L27/115;H01L29/792;(IPC1-7):H01L29/792;H01L21/823 主分类号 G11C16/04
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