发明名称 PLASMA PROCESSING APPARATUS AND PLASMA PROCESSING METHOD
摘要 <P>PROBLEM TO BE SOLVED: To provide a plasma processing method enhancing plasma processing characteristics, reproducibility of the plasma processing characteristics, and reducing plasma processing cost by stably achieving matching adjustment of high frequency power in the plasma processing method for processing a workpiece set in a reaction vessel by introducing a plurality of high frequency powers having different frequencies into the reaction vessel and decomposing raw gas in the reaction vessel, and to provide a plasma processing apparatus. <P>SOLUTION: Inductance L1 from the output end of the last stage impedance element of a matching circuit for high frequency power having the highest frequency to a power synthesizing point and inductance L2 from the output end of the last stage impedance element of the matching circuit for high frequency power having the lowest frequency to the power synthesizing point are set so as to be 2.0&times;L1&le;L2. <P>COPYRIGHT: (C)2005,JPO&NCIPI
申请公布号 JP2005142150(A) 申请公布日期 2005.06.02
申请号 JP20040261028 申请日期 2004.09.08
申请人 CANON INC 发明人 MURAYAMA HITOSHI
分类号 H05H1/46;C23C16/509 主分类号 H05H1/46
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