Tester device, inspection device, and interconnection board receiving unit for the tester device and inspection device

摘要

A tester device including a tester section which includes a tester, an interconnection board receiving unit fixed on the tester section, and a light source. The interconnection board receiving unit has first and second interconnection boards electrically connected to the tester in the tester section, and a contact section electrically connecting the second interconnection board to an external probe. A cut section for an optical-path is provided in the second interconnection board. The interconnection board receiving unit supports the second interconnection board so as to provide the cut section at the side of the tester section. The light source is moved between an inspection position at which the light source faces the cut section in the second interconnection board and an escape position at which the light source does not face the second interconnection board.