| 摘要 |
PROBLEM TO BE SOLVED: To provide a semiconductor integrated circuit that highly accurately detects a leak current component due to failure with variations reduced in a background current without cutting off the supply of power to functional circuit blocks, when performing IDDQ test on the integrated circuit using a micro-process, and to provide a test method. SOLUTION: A block supply selection circuit 10 is provided for selecting a specific functional circuit block based on a control signal from among the plurality of functional circuit blocks constituting the semiconductor integrated circuit, and for outputting, as an internal clock, a clock signal inputted from an external terminal to the selected functional circuit block. When performing IDDQ test, transistors toggled by an external clock signal input are limited only to transistors in the functional circuit block selected by the selection circuit 10 to reduce variations in the background current caused by a change of state of unselected functional circuit blocks. COPYRIGHT: (C)2005,JPO&NCIPI
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