SEMICONDUCTOR DEVICE HAVING A SCAN CHAIN FOR DEBUGGING AND DEBUGGING METHOD USING THE SCAN CHAIN,申请号KR20030085519-传众专利搜索

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发明名称	SEMICONDUCTOR DEVICE HAVING A SCAN CHAIN FOR DEBUGGING AND DEBUGGING METHOD USING THE SCAN CHAIN
摘要
申请公布号	KR20050051856(A)	申请公布日期	2005.06.02
申请号	KR20030085519	申请日期	2003.11.28
申请人	SAMSUNG ELECTRONICS CO., LTD.	发明人	SEONG, NAK HEE;PARK, JAE HONG;LIM, KYOUNG MOOK
分类号	H01L21/66;(IPC1-7):H01L21/66	主分类号	H01L21/66
代理机构		代理人
主权项
地址

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