发明名称 SCANNER AND SCANNING PROBE MICROSCOPE
摘要 PROBLEM TO BE SOLVED: To raise the scanning speed of a tube scanner, to make the tube scanner compact, and to make a scanning probe microscope compact by using the tube scanner made compact for the scanning probe microscope. SOLUTION: The tube scanner is provided with a cylindrical piezoelectric element; a node dividing the piezoelectric element in its longitudinal direction; and a voltage impressing means for impressing a voltage on the piezoelectric element on both sides of the node. The scanning probe microscope is provided with a sample, a probe opposed to the sample; and a tube scanner for two-dimensionally relatively scanning the sample and the probe and changing the distance between the sample and the probe and displays images on the basis of a signal detected by physical quantities acting between the probe and the sample. In the scanning probe microscope, the tube scanner is the above-mentioned tube scanner. COPYRIGHT: (C)2005,JPO&NCIPI
申请公布号 JP2005140568(A) 申请公布日期 2005.06.02
申请号 JP20030375305 申请日期 2003.11.05
申请人 JEOL LTD 发明人 AOKI SUSUMU
分类号 G01B21/30;G01Q10/02;G01Q10/04;H01L41/09;H01L41/187;(IPC1-7):G01N13/10 主分类号 G01B21/30
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