NONDESTRUCTIVE AND NONCONTACT ANALYSIS SYSTEM,申请号SG20040006303-传众专利搜索

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发明名称	NONDESTRUCTIVE AND NONCONTACT ANALYSIS SYSTEM
摘要
申请公布号	SG111281(A1)	申请公布日期	2005.05.30
申请号	SG20040006303	申请日期	2004.10.28
申请人	NEC ELECTRONICS CORPORATION	发明人	KIYOSHI NIKAWA
分类号	G01N27/72;G01R31/302;G01R31/311	主分类号	G01N27/72
代理机构		代理人
主权项
地址

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