发明名称 UNEVENNESS INSPECTION METHOD ON PARTITION SURFACE OF HONEYCOMB STRUCTURE AND INSPECTION DEVICE THEREFOR
摘要 <p><P>PROBLEM TO BE SOLVED: To provide an unevenness inspection method on a partition surface of a honeycomb structure for simply performing unevenness inspection on a partition surface of a honeycomb structure. <P>SOLUTION: According to this unevenness inspection method on a partition surface of a honeycomb structure, diffused light is let into the honeycomb structure 2 from one end surface 8 side thereof by a lighting means 3, is caused to pass through the interior of a cell, and is let out from the other end surface 9 side of the honeycomb structure 2. The let-out diffused light is turned into transmitted light by causing it to pass through a semitransparent screen 4 disposed on the other end surface 9 side of the honeycomb structure 2. A transmitted image 13 consisting of light and dark patterns of transmitted light is projected on a surface of the screen 4 on the transmitted light side. The transmitted image 13 projected on the screen 4 is imaged by an imaging means 5. Light and dark patterns in an acquired image are analyzed by an analysis means 6, thereby inspecting the degree of unevenness of the partition surface for each cell. <P>COPYRIGHT: (C)2005,JPO&NCIPI</p>
申请公布号 JP2005134140(A) 申请公布日期 2005.05.26
申请号 JP20030367339 申请日期 2003.10.28
申请人 NGK INSULATORS LTD 发明人 KONDO TAKAHIRO;MIZUTANI TERUHIRO;AOKI YOICHI
分类号 G01B11/30;G01N21/894;G01N21/954;G06T7/00;(IPC1-7):G01N21/954 主分类号 G01B11/30
代理机构 代理人
主权项
地址