发明名称
摘要 PROBLEM TO BE SOLVED: To uniformly treat the surface of a substrate and to save space by moving one supply nozzle selected from plural nozzles positioned in a stand-by region on the substrate, supplying a treating liquid on the substrate and standing-by the other nozzles in the stand-by region. SOLUTION: Plural supply nozzles, for example, 2 nozzles 52, 62 are provided in accordance with the kinds of the treating liquids, for example, developers, applied on a wafer W used in each lot. That is, one supply nozzle 52 moves from one end side to another side of the wafer W and applies the developer to the wafer W. At this time, another supply nozzle 62 is on stand-by in the stand-by region outside the wafer W. After the supply nozzle 52 is returned to the stand-by region 7, the position of the supply nozzles 52 and the supply nozzle 62 are switched by the cooperation of a moving structure and an elevating structure. Thus, liquid sagging is not generated on the wafer W so that the wafer W is treated uniformly.
申请公布号 JP3652559(B2) 申请公布日期 2005.05.25
申请号 JP19990233913 申请日期 1999.08.20
申请人 发明人
分类号 B05D1/40;B05C5/02;B05C11/08;G03F7/30;H01L21/027;(IPC1-7):B05C5/02 主分类号 B05D1/40
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