Testing circuit for SoC and method of testing the SoC,申请号KR20020074418-传众专利搜索

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发明名称	Testing circuit for SoC and method of testing the SoC
摘要
申请公布号	KR100491052(B1)	申请公布日期	2005.05.24
申请号	KR20020074418	申请日期	2002.11.27
申请人		发明人
分类号	G11C29/00;(IPC1-7):G11C29/00	主分类号	G11C29/00
代理机构		代理人
主权项
地址

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