发明名称 |
MANUFACTURING METHOD FOR TELESCOPIC CONTACT, CONTACT MANUFACTURED BY THE METHOD AND INSPECTION DEVICE OR ELECTRONIC INSTRUMENT PROVIDED WITH THE CONTACT |
摘要 |
PROBLEM TO BE SOLVED: To manufacture at low cost a high-reliability contact for inspection or connection in which a large current can be made to conduct. SOLUTION: In the method for manufacturing the contact electrically conducted to an electrode of an electronic instrument or an inspection device, there are provided a process to form a resin mold by a metal mold, a process to form layers composed of metal materials by electrocasting and a process to form a spiral spring protruding outside in a telescopic state by applying projection processing to the layer composed of the metal material. COPYRIGHT: (C)2005,JPO&NCIPI |
申请公布号 |
JP2005129428(A) |
申请公布日期 |
2005.05.19 |
申请号 |
JP20030365596 |
申请日期 |
2003.10.27 |
申请人 |
SUMITOMO ELECTRIC IND LTD |
发明人 |
HAGA TAKESHI |
分类号 |
G01R1/067;C25D1/00;G01R1/04;G01R3/00;H01R13/24;H01R43/16;(IPC1-7):H01R43/16 |
主分类号 |
G01R1/067 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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