发明名称 PLANAR SHAPE MEASURING METHOD AND SYSTEM
摘要 PROBLEM TO BE SOLVED: To accurately measure planar shape without being affected by motion error of moving mechanism when scan-measuring a plane to be tested with an interferometer. SOLUTION: When a planar shape in a region exceeding a measuring region corresponding to the opening diameter of the interferometer is measured by relatively moving a specimen 10 having a plane to be tested and the interferometer 14 for measuring the planar shape with a moving mechanism (X slider 18, Y table 12) in a direction parallel to the tested plane, and measuring in turn the tested plane gradually shifting the measuring position with the interferometer, and connecting each obtained measured result, the displacements to each reference level of reference meters 24, 22 placed on a meteorology frame 20 supported independently of the specimen and the interferometer are measured with displacement sensors 28, 26 each supported in a specific relation to the specimen 10 and the interferometer 14 as motion error of the moving mechanism for each measuring position. When each measured result is connected, compensation is done based on the motion error measured at the particular position. COPYRIGHT: (C)2005,JPO&NCIPI
申请公布号 JP2005127805(A) 申请公布日期 2005.05.19
申请号 JP20030362440 申请日期 2003.10.22
申请人 MITSUTOYO CORP 发明人 UEJIMA YASUSHI;HAINO HIROSHI
分类号 G01B11/24;(IPC1-7):G01B11/24 主分类号 G01B11/24
代理机构 代理人
主权项
地址