| 摘要 |
The invention provides a test device for testing circuit units ( 101 a- 101 n) to be tested, having connecting units ( 106 a- 106 n) for connecting the circuit units ( 101 a- 101 n) to be tested to the test device, a test system ( 100 ) and an output unit ( 108 ) for outputting test result data, the test device having a determining unit ( 103 ) for determining those of the measurement data ( 110 a- 101 n) which correspond for a predeterminable number of circuit units ( 101 a- 101 n) to be tested, and for defining the corresponding measurement data ( 110 a- 110 n) as the expected data ( 111 ); and comparison units ( 104 a- 104 n) for comparing the measurement data ( 110 a- 110 n) generated by the circuit units ( 101 a- 101 n) to be tested in a manner dependent on the test data ( 112 ) written in with the expected data ( 111 ) in order to obtain comparison data ( 115 a- 115 n).
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