发明名称 |
EINRICHTUNG UND VERFAHREN ZUR ANALYSE ATOMARER UND/ODER MOLEKULARER ELEMENTE MITTELS WELLENLÄNGENDISPERSIVER, RÖNTGENSPEKTROMETRISCHER EINRICHTUNGEN |
摘要 |
In a device and a method for the analysis of atomic and molecular elements by way of wavelength dispersive x-ray spectrometric structures including at least one mirror or focussing device having a multi-layer structure onto which fluorescent radiation generated by primary x-ray or electrons beams from a sample to be examined is directed and the reflected fluorescence radiation is supplied to a measuring device for determining the nature of impurities contained in the sample, the multi-layer structure consists of at least a lanthanum layer and a boron carbide layer. |
申请公布号 |
AT294384(T) |
申请公布日期 |
2005.05.15 |
申请号 |
AT20000947775T |
申请日期 |
2000.06.03 |
申请人 |
GKSS-FORSCHUNGSZENTRUM GEESTHACHT GMBH |
发明人 |
MICHAELSEN, CARSTEN;BORMANN, RUEDIGER |
分类号 |
G01N23/223;G21K1/06;(IPC1-7):G01N23/20 |
主分类号 |
G01N23/223 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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