发明名称 System for rapidly and uniformly cooling resist
摘要 Resist coated wafers are rapidly and uniformly cooled by a fluid that has been cooled through the Joule-Thompson effect. Fluid from a high pressure reservoir is vented into a chamber that contains the substrates. By varying the pressure difference between the reservoir and the chamber, the temperature of the cooling fluid entering the chamber can be controlled. By also controlling the flow rate through the chamber, the average temperature difference between the fluid in the chamber and the substrates may be limited, whereby more uniform cooling is obtained. While the chamber pressure is lower than that in the high pressure reservoir, the chamber pressure may still be substantially greater than atmospheric. An elevated chamber pressure raises the specific heat and residence time of the fluid in the chamber, which also promotes uniform cooling.
申请公布号 US6889763(B1) 申请公布日期 2005.05.10
申请号 US20000707413 申请日期 2000.11.06
申请人 ADVANCED MICRO DEVICES, INC. 发明人 SUBRAMANIAN RAMKUMAR;RANGARAJAN BHARATH;TEMPLETON MICHAEL K.
分类号 F25B9/02;H01L21/00;(IPC1-7):F25B29/00 主分类号 F25B9/02
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